Browsing by Author "Larbalestier, David C."
Now showing items 60-79 of 111
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Magnetization properties of a SnMo6S8 single crystal
Le Lay, Luc; Willis, Tomas C.; Larbalestier, David C. (1991) -
Magneto-optical imaging of transport currents in YBa2Cu3O7-x on RABiTS [trademark]
Feldmann, D. Matthew; Reeves, Jodi L.; Polyanskii, Anatoli; Goyal, Amit; Feenstra, Ron; Lee, Dominic F.; Paranthaman, M. Parans; Kroeger, Donald M.; Christen, David K.; Babcock, Susan E.; Larbalestier, David C. (Institute of Electrical and Electronics Engineers Inc, 2001) -
Magnets for the Tandem Mirror Fusion Power-Reactor Witamir-i
Maurer, Walter; Larbalestier, David C.; Sviatoslavsky, Igor N. (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 1981) -
Manufacture and Evaluation of Nb3sn Conductors Fabricated by the Mjr Method
McDonald, William K.; CURTIS, C.W.; Scanlan, Ronald M.; Larbalestier, David C.; Marken, Kenneth R.; Smathers, David Bird (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 1983) -
Measurement of the critical temperature transition and composition gradient in powder-in-tube Nb3Sn composite wire
Hawes, Christopher D.; Lee, Peter J.; Larbalestier, David C. (IEEE, Piscataway, NJ, USA, 2000) -
The metallurgical design of Nb-Ti and Nb3Sn multifilament superconductors
Larbalestier, David C. (1979) -
Microchemical and microstructural comparison of high performance Nb3Al composites
Lee, Peter J.; Squitieri, Alexander A.; Larbalestier, David C.; Takeuchi, Takao; Banno, Nobuya; Fukuzaki, Tomokazu; Wada, Hitoshi (Institute of Electrical and Electronics Engineers Inc, 2003) -
Microstructural and Compositional Gradients in the Filament-Matrix Region of Nb-Ti Wire Composites
Faase, Kenneth J.; Warnes, William H.; Lee, Peter J.; Larbalestier, David C. (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 1995) -
Microstructural and magneto-optical characterization of high Jc BSCCO-2223/Ag tapes
Jiang, Jianyi; Shields, Trevor C.; Abell, J. Stuart; Polyanskii, Anatoli; Feldmann, D. Matthew; Larbalestier, David C. (IEEE, Piscataway, NJ, USA, 1999) -
Microstructure and Jc improvements in overpressure processed Ag-sheathed Bi-2223 tapes
Yuan, Yongwen; Jiang, Jianyi; Cai, Xueyu; Patnaik, Satyabrata; Polyanskii, Anatoli; Hellstrom, Eric E.; Larbalestier, David C.; Williams, Robert K.; Huang, Yibing (Institute of Electrical and Electronics Engineers Inc, 2003) -
The microstructure and microchemistry of high critical current Nb3Sn strands manufactured by the bronze, internal-Sn and PIT techniques
Lee, Peter J.; Fischer, Chad M.; Naus, Michael T.; Squitieri, Alexander A.; Larbalestier, David C. (Institute of Electrical and Electronics Engineers Inc, 2003) -
Microstructure property relationships in Nb-Ti-Ta
Lee, Peter J.; Larbalestier, David C.; McKinnell, James Charles; McInturff, Alfred D. (1993) -
Microstructure Superconducting Property Relationships in a Fermilab Nb-46.5w-0ti Filamentary Superconducting Composite
West, Anne W.; Larbalestier, David C. (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 1981) -
Modeling the current-voltage characteristics of silver-sheathed Bi-Sr-Ca-Cu-O tapes
Gurevich, Alex; Pashitski, Alex E.; Edelman, Harry S.; Larbalestier, David C. (1993) -
Multiple peaks in the angular and field dependence of the critical currents in Nb-47wt%Ti/Cu multilayers
Kadyrov, Ernest V.; Cooley, Lance D.; Gurevich, Alex; Lee, Peter J.; Larbalestier, David C. (IEEE, 1997) -
Nanoscale-SiC doping for enhancing Jc and Hc2 in superconducting MgB2
Dou, Shi Xue; Braccini, Valeria; Soltanian, Saied; Klie, Robert F.; Zhu, Yimei; Li, Shuang; Wang, Xiaolin; Larbalestier, David C. (American Institute of Physics, 2004) -
Nb3Sn: Macrostructure, microstructure, and property comparisons for bronze and internal Sn process strands
Lee, Peter J.; Squitieri, Alexander A.; Larbalestier, David C. (IEEE, Piscataway, NJ, USA, 2000) -
Non-uniform deformation of niobium diffusion barriers in niobium-titanium wire
Heussner, Robert W.; Lee, Peter J.; Larbalestier, David C. (1993) -
Observations of the Effect of Pre-Reaction on the Properties of Nb3sn Bronze Composites
Smathers, David Bird; Marken, Kenneth R.; Larbalestier, David C.; Scanlan, Ronald M. (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 1983) -
On the role of pre-existing, unhealed cracks on the bending strain response of Ag-clad (Bi,Pb)2Sr2Ca2Cu3Ox tapes
Polak, Milan; Parrell, Jeffrey A.; Polyanskii, Anatoli; Pashitski, Alex E.; Larbalestier, David C. (1997)