Now showing items 2-2 of 2

    • Double-layer-relevant laboratory results 

      Diebold, Daniel A.; Forest, Chris Eliot; Hershkowitz, Noah; Hsieh, Man-Kam; Intrator, Thomas P.; Kaufman, D.; Kim, Gon-Ho; Lee, Sang Geun; Menard, Jonathan E. (Publ by IEEE, Piscataway, NJ, USA, 1992)