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X-ray scattering evidence for the structural nature of fatigue in epitaxial Pb(Zr, Ti)O-3 films

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Author(s)
Auciello, Orlando; Eom, Chang-Beom; Streiffer, Stephen K.; Bai, Guo-Ren; Eastman, Jeffrey A.; Ghosh, Kartik C.; Stephenson, G. Brian; Lee, Mark K.; Thompson, Carol; Munkholm, Anneli
Publisher
American Institute of Physics
Citation
The following article appeared in Thompson, C., Munkholm, A., Streiffer, S.K., Stephenson, G.B., Ghosh, K., Eastman, J.A., et al. (2001). X Ray Scattering Evidence For The Structural Nature Of Fatigue In Epitaxial Pb(Zr, Ti)O 3 Films. Applied Physics Letters, 78(22), 3511-3513. and may be found at http://link.aip.org/link/?apl/78/3511
Date
2001
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http://www.aip.org; http://apl.aip.org/
Description
This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
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