Thickness dependence of structural and piezoelectric properties of epitaxial Pb(Zr0.52Ti0.48)O3 films on Si and SrTiO3 substrates

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Author(s): Kim, Dong Min; Eom, Chang-Beom; Nagarajan, Valanoor; Ouyang, Jun; Ramesh, Ramamoorthy; Vaithyanathan, Venugopalan; Schlom, Darrell G.
Publisher: American Institute of Physics Inc., Melville, NY 11747-4502, United States
Citation: The following article appeared in Kim, D.M., Eom, C.B., Nagarajan, V., Ouyang, J., Ramesh, R., Vaithyanathan, V., et al. (2006). Thickness Dependence Of Structural And Piezoelectric Properties Of Epitaxial Pb(Zr0.52 Ti0.48)O3 Films On Si And Sr Ti O3 Substrates. Applied Physics Letters, 88(14), 142904-. and may be found at http://link.aip.org/link/?apl/88/142904
Date: 2006
Part of: http://www.aip.org; http://apl.aip.org/
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Permanent link: http://digital.library.wisc.edu/1793/8864
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