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Thickness dependence of structural and piezoelectric properties of epitaxial Pb(Zr0.52Ti0.48)O3 films on Si and SrTiO3 substrates

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Author(s)
Kim, Dong Min; Eom, Chang-Beom; Nagarajan, Valanoor; Ouyang, Jun; Ramesh, Ramamoorthy; Vaithyanathan, Venugopalan; Schlom, Darrell G.
Publisher
American Institute of Physics Inc., Melville, NY 11747-4502, United States
Citation
The following article appeared in Kim, D.M., Eom, C.B., Nagarajan, V., Ouyang, J., Ramesh, R., Vaithyanathan, V., et al. (2006). Thickness Dependence Of Structural And Piezoelectric Properties Of Epitaxial Pb(Zr0.52 Ti0.48)O3 Films On Si And Sr Ti O3 Substrates. Applied Physics Letters, 88(14), 142904-. and may be found at http://link.aip.org/link/?apl/88/142904
Date
2006
Part of
http://www.aip.org; http://apl.aip.org/
Description
This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
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http://digital.library.wisc.edu/1793/8864 
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