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Thickness dependence of structural and piezoelectric properties of epitaxial Pb(Zr0.52Ti0.48)O3 films on Si and SrTiO3 substrates

Kim, Dong Min; Eom, Chang-Beom; Nagarajan, Valanoor; Ouyang, Jun; Ramesh, Ramamoorthy; Vaithyanathan, Venugopalan; Schlom, Darrell G. (American Institute of Physics Inc., Melville, NY 11747-4502, United States; 2006)

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