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Showing 1928-1947 of 1947

What do packet dispersion techniques measure?

Dovrolis, Constantinos; Ramanathan, Parameswaran; Moore, David (Institute of Electrical and Electronics Engineers Inc; 2001)
What is scalability?

Hill, Mark D. (1990)
Where is Software Headed - a Virtual Round-Table

Lewis, Ted; Power, Dave; Meyer, Bertrand; Grimes, Jack; Potel, Mike; Vetter, Ron; Laplante, Phil; Pree, Wolfgang; Pomberger, Gustav; Hill, Mark D.; Larus, James R.; Wood, David A.; El-Rewini, Hesham; Weide, Bruce W. (IEEE COMPUTER SOC; 1995)
Whistler-mode electron cyclotron emission from the Phaedrus-B end cell

Cui, Binsheng; Probert, Paul H.; Brooker, Peter D.; Nonn, Paul D.; Keil, Douglas L.; Hershkowitz, Noah; Majeski, Richard P.; Breun, Robert A.; Ellis, Richard F. (1989)
A wireless system for multi-channel transmission of EEG Signals

Yu, Bin (Dec 15, 2010)
Wisconsin mixture characterization using the Asphalt Mixture Performance Tester (AMPT) on historical aggregate structures

Bonaquist, Ramon (Wisconsin Highway Research Program; Jan 2010)
Wisconsin truck size and weight study

Wittwer, Ernie F.; Bittner, Jason; Adams, Teresa M. (National Center for Freight and Infrastructure Research and Education; Jun 2009)
The Wisconsin Wind Tunnel Project: an annotated bibliography

Hill, Mark D.; Larus, James R.; Wood, David A. (1994)
WISCTECH 2008: 1st Annual Wisconsin Stem Cell Technology Symposium

Murphy, William (Sep 23, 2008)
A W-Matrix Methodology for Solving Sparse Network Equations on Multiprocessor Computers

Alvarado, Fernando L.; Padilha-Feltrin, Antonio; Morelato França, André Luiz (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC; 1992)
A worst-case estimate of stability probability for polynomials with multilinear uncertainty structure

Ross, Sheila R.; Barmish, B. Ross (Institute of Electrical and Electronics Engineers Inc; 2000)
X-RAY: a non-invasive exclusive caching mechanism for RAIDs

Bairavasundaram, Lakshmi N.; Sivathanu, Muthian; Arpaci-Dusseau, Andrea C.; Arpaci-Dusseau, Remzi H. (ACM; 2004)
X-ray microdiffraction study of Cu interconnects

Zhang, Xueyuan; Solak, Harun H.; Cerrina, Francesco; Lai, Barry; Cai, Zhonghou; Ilinski, Peter; Legnini, Daniel G.; Rodrigues, William (American Institute of Physics Inc; 2000)
X-ray photoelectron spectroscopic study on sapphire nitridation for GaN growth by hydride vapor phase epitaxy: Nitridation mechanism

Dwikusuma, Fransiska; Kuech, Thomas F. (American Institute of Physics Inc; 2003)
X-ray photoemission determination of the Schottky barrier height of metal contacts to n-GaN and p-GaN

Kim, Jong Kyu; Lee, Jong-Lam; Rickert, Kimberly Anne; Ellis, Arthur B.; Himpsel, Franz J.; Dwikusuma, Fransiska; Kuech, Thomas F. (American Institute of Physics Inc; 2002)
X-ray photoemission spectroscopic investigation of surface treatments, metal deposition, and electron accumulation on InN

Rickert, Kimberly Anne; Ellis, Arthur B.; Himpsel, Franz J.; Lu, Hai; Schaff, William; Redwing, Joan M.; Dwikusuma, Fransiska; Kuech, Thomas F. (American Institute of Physics Inc; 2003)
X-ray scattering evidence for the structural nature of fatigue in epitaxial Pb(Zr, Ti)O-3 films

Auciello, Orlando; Eom, Chang-Beom; Streiffer, Stephen K.; Bai, Guo-Ren; Eastman, Jeffrey A.; Ghosh, Kartik C.; Stephenson, G. Brian; Lee, Mark K.; Thompson, Carol; Munkholm, Anneli (American Institute of Physics; 2001)
X-rays in electron-cyclotron-resonance processing plasmas

Castagna, Timothy Joseph; Shohet, J. Leon; Denton, Denice D.; Hershkowitz, Noah (1992)
An X-ray spectromicroscopic study of electromigration in patterned Al(Cu) lines

Solak, Harun H.; Lorusso, GianFranco; Singh-Gasson, Sangeet; Cerrina, Francesco (American Institute of Physics; 1999)
Yield-driven, false-path-aware clock skew scheduling

Tsai, Jeng-Liang; Baik, Dong Hyun; Chen, Charlie Chung-Ping; Saluja, Kewal K. (Institute of Electrical and Electronics Engineers Computer Society, Piscataway, NJ 08855-1331, United States; 2005)

Showing 1928-1947 of 1947