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dc.contributor.authorLee, Peter J.en_US
dc.contributor.authorLarbalestier, David C.en_US
dc.contributor.authorJablonski, Paul D.en_US
dc.date.accessioned2007-07-13T19:35:00Z
dc.date.available2007-07-13T19:35:00Z
dc.date.issued1995en_US
dc.identifier.citationLee, P. J., Larbalestier, D. C., & Jablonski, P. D. (1995). Quantification Of Pinning Center Thickness In Conventionally Processed And Powder Processed Artificial Pinning Center Microstructures. Ieee Transactions On Applied Superconductivity, 5(2 pt 2), 1701-1704.en_US
dc.identifier.urihttp://digital.library.wisc.edu/1793/11320
dc.descriptionThis material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.en_US
dc.format.extent453109 bytes
dc.format.mimetypeapplication/pdfen_US
dc.format.mimetypeapplication/pdf
dc.publisherIEEE, Piscataway, NJ, USAen_US
dc.relation.ispartofhttp://www.ieee.org/en_US
dc.relation.ispartofhttp://ieeexplore.ieee.org/servlet/opac?punumber=77en_US
dc.rightsCopyright 1995 Institute of Electrical and Electronics Engineersen_US
dc.rights©20xx IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.en_US
dc.titleQuantification of pinning center thickness in conventionally processed and powder processed artificial pinning center microstructuresen_US
dc.identifier.doihttp://dx.doi.org/10.1109/77.402904en_US


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