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The use of the in-field critical current density, Jc(0.1T), as a better descriptor of (Bi, Pb)2Sr2Ca2Cu3Ox/Ag tape performance

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Author(s)
Schwartzkopf, Louis; Jiang, Jianyi; Cai, Xueyu; Apodaca, Daniel; Larbalestier, David C.
Publisher
American Institute of Physics Inc
Citation
The following article appeared in Schwartzkopf, L.A., Jiang, J., Cai, X.Y., Apodaca, D., & Larbalestier, D.C. (1999). The Use Of The In Field Critical Current Density, Jc(0.1 T), As A Better Descriptor Of (Bi, Pb)2 Sr2 Ca2 Cu3 Ox/Ag Tape Performance. Applied Physics Letters, 75(20), 3168-3170. and may be found at http://link.aip.org/link/?apl/75/3168
Date
1999
Part of
http://www.aip.org; http://apl.aip.org/
Description
This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
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http://digital.library.wisc.edu/1793/11266 
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