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Characterization of individual filaments extracted from a Bi-2223/Ag tape

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dc.contributor.author van der Meer, Olaf en_US
dc.contributor.author Cai, Xueyu en_US
dc.contributor.author Jiang, Jianyi en_US
dc.contributor.author Parella, Ronald D. en_US
dc.contributor.author Huang, Yibing en_US
dc.contributor.author Larbalestier, David C. en_US
dc.contributor.author ten Haken, Bennie en_US
dc.contributor.author ten Kate, Herman H.J. en_US
dc.date.accessioned 2007-07-13T19:33:38Z
dc.date.available 2007-07-13T19:33:38Z
dc.date.issued 2003 en_US
dc.identifier.citation van der Meer, O., Cai, X., Jiang, J.Y., Parella, R.D., Huang, Y.B.B., Larbalestier, D.C., et al. (2003). Characterization Of Individual Filaments Extracted From A Bi 2223/Ag Tape. Ieee Transactions On Applied Superconductivity, 13(2), 2926-2929. en_US
dc.identifier.uri http://digital.library.wisc.edu/1793/11144
dc.description This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. en_US
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dc.format.extent 534483 bytes
dc.format.mimetype application/pdf en_US
dc.format.mimetype application/pdf
dc.publisher IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC en_US
dc.relation.ispartof http://www.ieee.org/ en_US
dc.relation.ispartof http://ieeexplore.ieee.org/servlet/opac?punumber=77 en_US
dc.rights Copyright 2003 Institute of Electrical and Electronics Engineers en_US
dc.rights ©20xx IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. en_US
dc.title Characterization of individual filaments extracted from a Bi-2223/Ag tape en_US

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