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Design and noise model for CCD-based, time-resolved PHA measurements

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Author(s)
Schooff, Ryan J.; Diem, Stephanie J.; Fonck, Raymond J.; Reinke, Matthew; Tritz, Kevin L.
Publisher
American Institute of Physics Inc
Citation
The following article appeared in Schooff, R., Diem, S., Fonck, R., Reinke, M., & Tritz, K. (2003). Design and noise model for CCD-based, time-resolved PHA measurements. In Proceedings of the 14th Topical Conference on High - Temperature Plasma Diagnostics, Jul 8-11 2002, 74 (3 II), 2007-2010. and may be found at http://link.aip.org/link/?rsi/74/2007
Date
2003
Part of
http://www.aip.org; http://rsi.aip.org
Description
This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
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http://digital.library.wisc.edu/1793/10498 
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