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Characterization of individual filaments extracted from a Bi-2223/Ag tape

van der Meer, Olaf; Cai, Xueyu; Jiang, Jianyi; Parella, Ronald D.; Huang, Yibing; Larbalestier, David C.; ten Haken, Bennie; ten Kate, Herman H.J. (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC; 2003)
Critical current limiting factors in post annealed (Bi,Pb)2Sr2Ca2Cu3Ox tapes

Jiang, Jianyi; Cai, Xueyu; Chandler, Jermal G.; Patnaik, Satyabrata; Polyanskii, Anatoli; Yuan, Yongwen; Hellstrom, Eric E.; Larbalestier, David C. (Institute of Electrical and Electronics Engineers Inc; 2003)
Evolution of core density of Ag-clad Bi-2223 tapes during process

Jiang, Jianyi; Cai, Xueyu; Chandler, Jermal G.; Rikel, Mark O.; Hellstrom, Eric E.; Parrella, Ronald D.; Yu, Dingan; Li, Qi; Rupich, Martin W.; Riley, Gilbert N., Jr.; Larbalestier, David C. (Institute of Electrical and Electronics Engineers Inc; 2001)
Examination of current limiting mechanisms in monocore Bi2Sr2Ca2Cu3Ox tape with high critical current density

Polyanskii, Anatoli; Feldmann, D. Matthew; Patnaik, Satyabrata; Jiang, Jianyi; Cai, Xueyu; Larbalestier, David C.; DeMoranville, Kenneth L.; Yu, Dingan; Parrella, Ronald D. (Institute of Electrical and Electronics Engineers Inc; 2001)
Improving the critical current density in Bi-2223 wires via a reduction of the secondary phase content

Huang, Yibing; Cai, Xueyu; Holesinger, Terry G.; Maroni, Victor A.; Yu, Dingan; Parrella, Ronald D.; Rupich, Martin W.; Hellstrom, Eric E.; Teplitsky, Mark; Venkataraman, Kartik; Otto, Alexander; Larbalestier, David C. (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC; 2003)
Irreversibility fields of Bi-2223 at 30-77 K

Chandler, Jermal G.; Jiang, Jianyi; Cai, Xueyu; Schwartzkopf, Louis; Larbalestier, David C. (Institute of Electrical and Electronics Engineers Inc; 2003)
Local measurement of current density by magneto-optical current reconstruction in normally and overpressure processed Bi-2223 tapes

Patnaik, Satyabrata; Feldmann, D. Matthew; Polyanskii, Anatoli; Yuan, Yongwen; Jiang, Jianyi; Cai, Xueyu; Hellstrom, Eric E.; Larbalestier, David C.; Huang, Yibing (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC; 2003)
Microstructure and Jc improvements in overpressure processed Ag-sheathed Bi-2223 tapes

Yuan, Yongwen; Jiang, Jianyi; Cai, Xueyu; Patnaik, Satyabrata; Polyanskii, Anatoli; Hellstrom, Eric E.; Larbalestier, David C.; Williams, Robert K.; Huang, Yibing (Institute of Electrical and Electronics Engineers Inc; 2003)
Overpressure processing Bi2223/Ag tapes

Rikel, Mark O.; Williams, Robert K.; Cai, Xueyu; Polyanskii, Anatoli; Jiang, Jianyi; Wesolowski, Denne; Hellstrom, Eric E.; Larbalestier, David C.; DeMoranville, Kenneth L.; Riley, Gilbert N., Jr. (IEEE; 2001)
A shell model for the filament structure of Bi-2223 conductors

Holesinger, Terry G.; Kennison, Jack A.; Liao, Shaolin; Yuan, Yongwen; Jiang, Jianyi; Cai, Xueyu; Hellstrom, Eric E.; Larbalestier, David C.; Baurceanu, Ruxandra M.; Maroni, Victor A.; Huang, Yibing (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC; 2005)
Significantly enhanced critical current density in Ag-sheathed (Bi,Pb) 2Sr2Ca2Cu3Ox composite conductors prepared by overpressure processing in final heat treatment

Yuan, Yongwen; Jiang, Jianyi; Cai, Xueyu; Larbalestier, David C.; Hellstrom, Eric E.; Huang, Yibing; Parrella, Ronald D. (American Institute of Physics Inc; 2004)
Transport properties across high-angle bicrystals of melt-textured YBa2Cu3O6+x

Field, Michael B.; Cai, Xueyu; Babcock, Susan E.; Larbalestier, David C. (1993)
The use of the in-field critical current density, Jc(0.1T), as a better descriptor of (Bi, Pb)2Sr2Ca2Cu3Ox/Ag tape performance

Schwartzkopf, Louis; Jiang, Jianyi; Cai, Xueyu; Apodaca, Daniel; Larbalestier, David C. (American Institute of Physics Inc; 1999)

Showing 1-13 of 13

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