Browsing by Author "Abelson, J. R."
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Evidence from atomistic simulations of fluctuation electron microscopy for preferred local orientations in amorphous silicon
Khare, S. V.; Nahkmanson, S. M.; Voyles, P. M.; Keblinski, P.; Abelson, J. R. (2004-08)Simulations from a family of atomistic structural models for unhydrogenated amorphous silicon suggest that fluctuation electron microscopy experiments have observed orientational order of paracrystalline grains in amorphous ... -
Increasing medium-range order in amorphous silicon with low-energy ion bombardment
Gerbi, J. E.; Voyles, P. M.; Treacy, M. M. J.; Gibson, J. M.; Abelson, J. R. (2003)We have observed the existence of medium?range order in amorphous silicon with the fluctuation electron microscopy technique. We hypothesize that this structure is produced during the highly nonequilibrium deposition ... -
Structural disorder induced in hydrogenated amorphous silicon by light soaking
Gibson, J. M.; Treacy, M. M. J.; Voyles, P. M.; Jin, H-C.; Abelson, J. R. (1998)We show, using variable coherence transmission electron microscopy, that light soaking of amorphous hydrogenated silicon thin films leads to structural changes. We speculate that the structural changes are associated with ...