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Pogrebnyakov, A.V.; Redwing, J.M.; Giencke, J.E.; Eom, C.B.; Vaithyanathan, V.; Schlom, D.G.; Soukiassian, A.; Mi, S.B.; Jia, C.L.; Chen, J.; Hu, Y.F.; Cui, Y.; Li, Q.; Xi, X.X.
(IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC; 2005)
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Parrell, Jeffrey A.; Larbalestier, David C.; Riley, G.N., Jr.; Li, Q.; Parrella, R.D.; Teplitsky, M.
(American Inst of Physics, Woodbury, NY, USA; 1996)
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Jiang, J.Y.; Cai, X.Y.; Chandler, J.G.; Rikel, M.O.; Hellstrom, Eric E.; Parrella, R.D.; Yu, D.; Li, Q.; Rupich, M.W.; Riley, G.N., Jr.; Larbalestier, David C.
(Institute of Electrical and Electronics Engineers Inc; 2001)
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Feldmann, D.M.; Larbalestier, David C.; Verebelyi, D.T.; Zhang, W.; Li, Q.; Riley, G.N., Jr.; Feenstra, R.; Goyal, A.; Lee, D.F.; Paranthaman, M.; Kroeger, D.M.; Christen, D.K.
(AMER INST PHYSICS; 2001)
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Li, Q.; Riley, G.N., Jr.; Parrella, R.D.; Fleshler, S.; Rupich, M.W.; Carter, W.L.; Willis, J.O.; Coulter, J.Y.; Bingert, J.F.; Sikka, V.K.; Parrell, Jeffrey A.; Larbalestier, David C.
(IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC; 1997)