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Comparison of magnetic- and chemical-boundary roughness in magnetic films and multilayers

Kelly, J.J., IV; Barnes, B.M.; Flack, F.; Lagally, D.P.; Savage, D.E.; Friesen, Mark; Lagally, Max G. (AIP; 2002)
Comparison of wear characteristics of etched-silicon and carbon nanotube atomic-force microscopy probes

Larsen, T.; Moloni, K.; Flack, F.; Eriksson, M.A.; Lagally, Max G.; Black, C.T. (AIP; 2002)
Controlled deposition of picoliter amounts of fluid using an ultrasonically driven micropipette

Larson, Bradley J.; Gillmor, Susan D.; Lagally, Max G. (American Institute of Physics Inc; 2004)
Correlations among sputter pressure, thickness, and coercivity in Al/Co/Cu magnetic thin films sputter-deposited on Si(001)

Barnes, B.M.; Kelly, J.J., IV; MacKay, J.F.; O'Brien, W.L.; Lagally, Max G. (Institute of Electrical and Electronics Engineers Inc; 2000)
Coulomb blockade in a silicon/silicon-germanium two-dimensional electron gas quantum dot

Klein, L.J.; Slinker, K.A.; Truitt, J.L.; Goswami, S.; Lewis, K.L.M.; Coppersmith, S.N.; van der Weide, Daniel W.; Friesen, Mark; Blick, Robert H.; Savage, D.E.; Lagally, Max G.; Tahan, Charlie; Joynt, Robert; Eriksson, M.A.; Chu, J.O.; Ott, J.A.; Mooney, P.M. (American Institute of Physics Inc., Melville, United States; 2004)
Determination of terrace size and edge roughness in vicinal Si{100} surfaces by surface-sensitive diffraction

Saloner, D.; Martin, J.A.; Tringides, M.C.; Savage, D.E.; Aumann, C.E.; Lagally, Max G. (1987)
dGermanium hut nanostressors on freestanding thin silicon membranes

Evans, P.G.; Tinberg, D.S.; Roberts, M.M.; Lagally, Max G.; Xiao, Y.; Lai, B.; Cai, Z. (AMER INST PHYSICS; 2005)
Direct observation by reflection high-energy electron diffraction of amorphous-to-crystalline transition in the growth of Sb on GaAs(110)

Savage, D.E.; Lagally, Max G. (1987)
Direct observation of interface roughness dependence of interfacial magnetism using diffuse X-ray resonant magnetic scattering

MacKay, J.F.; Teichert, C.; Lagally, Max G. (AIP; 1997)
A double mirror W/C multilayer monochromator for radiation biology applications

MacKay, J.F.; Pearson, D.W.; Nelms, B.E.; DeLuca, P.M., Jr; Gould, M.N.; Lagally, Max G. (AIP for American Assoc. Phys. Med; 1998)
Electrically isolated SiGe quantum dots

Tevaarwerk, E.; Rugheimer, P.P.; Castellini, O.M.; Keppel, D.G.; Utley, S.T.; Savage, D.E.; Lagally, Max G.; Eriksson, M.A. (AIP; 2002)
Electromechanical devices utilising thin Si diaphragms

Guckel, H.; Larsen, S.; Lagally, Max G.; Moore, G.; Miller, J.B.; Wiley, J.D. (1977)
Germanium hut nanostressors on freestanding thin silicon membranes

Evans, P.G.; Tinberg, D.S.; Roberts, M.M.; Lagally, Max G.; Xiao, Y.; Lai, B.; Cai, Z. (AIP; 2005)
Influence of beam coherence on measurements of roughness in film growth

Lagally, Max G.; Kariotis, R. (4)
Influence of Beam Coherence on Measurements of Roughness in Film Growth

Lagally, Max G.; Kariotis, R. (AMER INST PHYSICS; 1989)
Influence of oxygen on surface morphology of metalorganic vapor phase epitaxy grown GaAs (001)

Nayak, S.; Huang, J.-W.; Redwing, J.M.; Savage, D.E.; Lagally, Max G.; Kuech, Thomas F. (AIP; 1996)
INSTRUMENTATION FOR LOW-ENERGY ELECTRON DIFFRACTION

Lagally, Max G.; Martin, J.A. (1983)
Kinetics of titanium silicide formation on single-crystal Si:experiment and modeling

Pico, C.A.; Lagally, Max G. (1988)
Mechanical stability of ultrathin Ge/Si film on SiO2: The effect of Si/SiO2 interface

Huang, M.H.; Nairn, J.A.; Liu, F.; Lagally, Max G. (AMER INST PHYSICS; 2005)
Mechanism of organization of three-dimensional islands in SiGe/Si multilayers

Mateeva, E.; Sutter, P.; Bean, J.C.; Lagally, Max G. (AIP; 1997)

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