Browsing by Author "Shohet, J. Leon"
Now showing items 28-30 of 30
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Thin-oxide charging damage to microelectronic test structures in an electron-cyclotron-resonance plasma
Friedmann, James B.; Shohet, J. Leon; McVittie, James P.; Ma, Shawming (American Institute of Physics, 1995) -
VUV Photoemission Spectroscopy Characteristics of Graphene on SiO2
Morner, Cazimir (2011-05-15)The characterization of the photoemission properties of a graphene monolayer deposited on silicon dioxide under vacuum ultraviolet radiation is determined. Within the range of photon energies between 8 and 20eV, graphene ... -
X-rays in electron-cyclotron-resonance processing plasmas
Castagna, Timothy Joseph; Shohet, J. Leon; Denton, Denice D.; Hershkowitz, Noah (1992)