Browsing by Author "Larbalestier, David C."
Now showing items 5-24 of 111
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Characterization of individual filaments extracted from a Bi-2223/Ag tape
van der Meer, Olaf; Cai, Xueyu; Jiang, Jianyi; Parella, Ronald D.; Huang, Yibing; Larbalestier, David C.; ten Haken, Bennie; ten Kate, Herman H.J. (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2003) -
Cold work loss during heat treatment and extrusion of Nb-46.5Wt%Ti composites as measured by microhardness
Parrell, Jeffrey A.; Lee, Peter J.; Larbalestier, David C. (1993) -
Compositional and microstructural profiles across Nb3Sn filaments produced by different fabrication methods
Lee, Peter J.; Larbalestier, David C. (Institute of Electrical and Electronics Engineers Inc, 2001) -
Compositional Inhomogeneities in Nb-Ti and its Alloys
West, Anne W.; Warnes, William H.; Moffat, David Lincoln; Larbalestier, David C. (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 1983) -
Cooling rate effects on the microstructure, critical current density, and Tc transition of one- and two-powder BSCCO-2223 Ag-sheathed tapes
Parrell, Jeffrey A.; Larbalestier, David C.; Dorris, Steve E. (IEEE, Piscataway, NJ, USA, 1995) -
Critical current anisotropy in conventional and artificial pinning center round wire Nb-Ti superconductors
Nunes, Cristina Bormio; Heussner, Robert W.; Larbalestier, David C. (IEEE, Piscataway, NJ, USA, 1997) -
Critical current limiting factors in post annealed (Bi,Pb)2Sr2Ca2Cu3Ox tapes
Jiang, Jianyi; Cai, Xueyu; Chandler, Jermal G.; Patnaik, Satyabrata; Polyanskii, Anatoli; Yuan, Yongwen; Hellstrom, Eric E.; Larbalestier, David C. (Institute of Electrical and Electronics Engineers Inc, 2003) -
Critical currents and magnet applications of high-Tc superconductors
Larbalestier, David C. (1991) -
Critical currents: Just how critical are they?
Larbalestier, David C. (Institute of Electrical and Electronics Engineers Inc, 2001) -
Current barriers in Y-Ba-Cu-O coated conductors
Reeves, Jodi L.; Feldmann, D. Matthew; Yang, Chau-Yun; Larbalestier, David C. (Institute of Electrical and Electronics Engineers Inc, 2001) -
Dependence of critical current density on microstructure in the SnMo6S8 Chevrel phase superconductor
Bonney, Laura A.; Willis, Tomas C.; Larbalestier, David C. (1995) -
Dependence of critical temperature and resistivity of thin film Nb47wt%Ti on magnetron sputtering conditions
Hawes, Christopher D.; Cooley, Lance D.; Larbalestier, David C. (IEEE, Piscataway, NJ, USA, 1999) -
Determination of irreversibility field variations in mono- and multifilamentary (Bi,Pb)2Sr2Ca2Cu3Ox tapes by transport current methods
Anderson, John W.; Parrell, Jeffrey A.; Polak, Milan; Larbalestier, David C. (Am Inst Phys, Woodbury, NY, USA, 1997) -
Development of high performance multifilamentary Nb-Ti-Ta superconductor for LHC insertion quadrupoles
Lee, Peter J.; Fischer, Chad M.; Larbalestier, David C.; Naus, Michael T.; Squitieri, Alexander A.; Starch, William L.; Werner, Randall J.; Limon, Peter J.; Sabbi, Gianluca; Zlobin, Alexander; Gregory, Eric (IEEE, Piscataway, NJ, USA, 1999) -
Development of high performance Nb-Ti(Fe) multifilamentary superconductor for the LHC insertion quadrupoles
Lee, Peter J.; Fischer, Chad M.; Gabr-Rayan, Walid; Larbalestier, David C.; Naus, Michael T.; Squitieri, Alexander A.; Starch, William L.; Barzi, Emanuela Z.; Limon, Peter J.; Sabbi, Gianluca; Zlobin, Alexander; Kanithi, Hem; Hong, Seung; McKinnell, James Charles; Neff, D. (IEEE, Piscataway, NJ, USA, 1999) -
Development of in-situ second phase pinning structure in niobium-titanium based superconducting alloys
Seuntjens, Jeffrey M.; Larbalestier, David C. (1991) -
The effect of anisotropic flux pinning microstructure on the sample length dependence of the magnetization critical current density in niobium-titanium superconductors
Bormio Nunes, C.; Heussner, Robert W.; Larbalestier, David C. (American Institute of Physics, 1996) -
Effect of the maximum processing temperature on the microstructure and electrical properties of melt processed Ag-sheathed Bi2Sr2CaCu2Ox tape
Polak, Milan; Zhang, Wei; Polyanskii, Anatoli; Pashitski, Alex E.; Hellstrom, Eric E.; Larbalestier, David C. (IEEE, Piscataway, NJ, USA, 1997) -
Effect of wire drawing and cold rolling on the precursor 2212 phase texture and its subsequent influence on the (Bi,Pb)2Sr2Ca2Cu3Ox texture in Ag-clad tapes
Anderson, John W.; Parrell, Jeffrey A.; Sastry, Pamidi V.P.S.S.; Larbalestier, David C. (IEEE, Piscataway, NJ, USA, 1997) -
Electrodeposition process for the preparation of superconducting thallium oxide films
Bhattacharya, Raghu N.; Feldmann, D. Matthew; Larbalestier, David C.; Blaugher, Richard D. (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2001)