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Rikel, Mark O.; Williams, Robert K.; Cai, Xueyu; Polyanskii, Anatoli; Jiang, Jianyi; Wesolowski, Denne; Hellstrom, Eric E.; Larbalestier, David C.; DeMoranville, Kenneth L.; Riley, Gilbert N., Jr.
(IEEE; 2001)
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Reeves, Jodi L.; Polak, Milan; Zhang, Wei; Hellstrom, Eric E.; Babcock, Susan E.; Larbalestier, David C.; Inoue, Naomi; Okada, Michiya
(IEEE, Piscataway, NJ, USA; 1997)
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Ichinose, Ataru; Daniels, George A.; Yang, Chau-Yun; Larbalestier, David C.; Kikuchi, Akihiro; Tachikawa, Kyoji; Akita, Shirabe
(IEEE, Piscataway, NJ, USA; 1999)
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Li, Qi; Riley, Gilbert N., Jr.; Parrella, Ronald D.; Fleshler, Steven; Rupich, Martin W.; Carter, William L.; Willis, Jeffrey O.; Coulter, J. Yates; Bingert, John F.; Sikka, Vinod K.; Parrell, Jeffrey A.; Larbalestier, David C.
(IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC; 1997)
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