Browsing by Author "Lagally, Max G."
Now showing items 1-20 of 28
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Comparison of magnetic- and chemical-boundary roughness in magnetic films and multilayers
Kelly, John J., IV; Barnes, Bryan M.; Flack, Frank; Lagally, Doug P.; Savage, Donald E.; Friesen, Mark; Lagally, Max G. (American Institute of Physics, 2002) -
Comparison of wear characteristics of etched-silicon and carbon nanotube atomic-force microscopy probes
Larsen, Troy; Moloni, Katerina; Flack, Frank; Eriksson, Mark A.; Lagally, Max G.; Black, Charles T. (American Institute of Physics, 2002) -
Controlled deposition of picoliter amounts of fluid using an ultrasonically driven micropipette
Larson, Bradley J.; Gillmor, Susan D.; Lagally, Max G. (American Institute of Physics Inc, 2004) -
Correlations among sputter pressure, thickness, and coercivity in Al/Co/Cu magnetic thin films sputter-deposited on Si(001)
Barnes, Bryan M.; Kelly, John J., IV; MacKay, James F.; O'Brien, William L.; Lagally, Max G. (Institute of Electrical and Electronics Engineers Inc, 2000) -
Coulomb blockade in a silicon/silicon-germanium two-dimensional electron gas quantum dot
Klein, Levente J.; Slinker, Keith A.; Truitt, James L.; Goswami, Srijit; Lewis, Kristin L.M.; Coppersmith, Susan N.; van der Weide, Daniel W.; Friesen, Mark; Blick, Robert H.; Savage, Donald E.; Lagally, Max G.; Tahan, Charlie; Joynt, Robert; Eriksson, Mark A.; Cho, Jack O.; Ott, John A.; Mooney, Patricia M. (American Institute of Physics Inc., Melville, United States, 2004) -
Determination of terrace size and edge roughness in vicinal Si{100} surfaces by surface-sensitive diffraction
Saloner, D.; Martin, Joe Allen; Tringides, Michael C.; Savage, Donald E.; Aumann, Christopher Eugene; Lagally, Max G. (1987) -
dGermanium hut nanostressors on freestanding thin silicon membranes
Evans, Paul G.; Tinberg, Daniel S.; Roberts, Michelle M.; Lagally, Max G.; Xiao, Yanan; Lai, Barry; Cai, Zhonghou (American Institute of Physics, 2005) -
Direct observation by reflection high-energy electron diffraction of amorphous-to-crystalline transition in the growth of Sb on GaAs(110)
Savage, Donald E.; Lagally, Max G. (1987) -
Direct observation of interface roughness dependence of interfacial magnetism using diffuse X-ray resonant magnetic scattering
MacKay, James F.; Teichert, Christian; Lagally, Max G. (American Institute of Physics, 1997) -
A double mirror W/C multilayer monochromator for radiation biology applications
MacKay, James F.; Pearson, David W.; Nelms, Benjamin E.; De Luca, Paul M., Jr.; Gould, Michael N.; Lagally, Max G. (AIP for American Assoc. Phys. Med, 1998) -
Electrically isolated SiGe quantum dots
Tevaarwerk, Emma; Rugheimer, Paul P.; Castellini, Olivia M.; Keppel, Drew Garvin; Utley, S.T.; Savage, Donald E.; Lagally, Max G.; Eriksson, Mark A. (American Institute of Physics, 2002) -
Electromechanical devices utilising thin Si diaphragms
Guckel, Henry; Larsen, S.; Lagally, Max G.; Moore, George; Miller, Jeffrey B.; Wiley, John D. (1977) -
Germanium hut nanostressors on freestanding thin silicon membranes
Evans, Paul G.; Tinberg, Daniel S.; Roberts, Michelle M.; Lagally, Max G.; Xiao, Yanan; Lai, Barry; Cai, Zhonghou (American Institute of Physics, 2005) -
Influence of beam coherence on measurements of roughness in film growth
Lagally, Max G.; Kariotis, Robert (4) -
Influence of oxygen on surface morphology of metalorganic vapor phase epitaxy grown GaAs (001)
Nayak, Sabyasachi; Huang, Jen-Wu; Redwing, Joan M.; Savage, Donald E.; Lagally, Max G.; Kuech, Thomas F. (American Institute of Physics, 1996) -
INSTRUMENTATION FOR LOW-ENERGY ELECTRON DIFFRACTION
Lagally, Max G.; Martin, Joe Allen (1983) -
Kinetics of titanium silicide formation on single-crystal Si:experiment and modeling
Pico, Carey Alan; Lagally, Max G. (1988) -
Mechanical stability of ultrathin Ge/Si film on SiO2: The effect of Si/SiO2 interface
Huang, Minghuang; Nairn, John A.; Liu, Feng; Lagally, Max G. (American Institute of Physics, 2005) -
Mechanism of organization of three-dimensional islands in SiGe/Si multilayers
Mateeva, Eli; Sutter, Peter; Bean, John C.; Lagally, Max G. (American Institute of Physics, 1997) -
Microfabricated strained substrates for Ge epitaxial growth
Evans, Paul G.; Rugheimer, Paul P.; Lagally, Max G.; Lee, Chung-Hoon; Lal, Amit; Xiao, Yanan; Lai, Barry; Cai, Zhonghou (American Institute of Physics, 2005)