Browsing by Author "Jiang, Jianyi"
Now showing items 5-12 of 12
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Irreversibility fields of Bi-2223 at 30-77 K
Chandler, Jermal G.; Jiang, Jianyi; Cai, Xueyu; Schwartzkopf, Louis; Larbalestier, David C. (Institute of Electrical and Electronics Engineers Inc, 2003) -
Local measurement of current density by magneto-optical current reconstruction in normally and overpressure processed Bi-2223 tapes
Patnaik, Satyabrata; Feldmann, D. Matthew; Polyanskii, Anatoli; Yuan, Yongwen; Jiang, Jianyi; Cai, Xueyu; Hellstrom, Eric E.; Larbalestier, David C.; Huang, Yibing (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2003) -
Microstructural and magneto-optical characterization of high Jc BSCCO-2223/Ag tapes
Jiang, Jianyi; Shields, Trevor C.; Abell, J. Stuart; Polyanskii, Anatoli; Feldmann, D. Matthew; Larbalestier, David C. (IEEE, Piscataway, NJ, USA, 1999) -
Microstructure and Jc improvements in overpressure processed Ag-sheathed Bi-2223 tapes
Yuan, Yongwen; Jiang, Jianyi; Cai, Xueyu; Patnaik, Satyabrata; Polyanskii, Anatoli; Hellstrom, Eric E.; Larbalestier, David C.; Williams, Robert K.; Huang, Yibing (Institute of Electrical and Electronics Engineers Inc, 2003) -
Overpressure processing Bi2223/Ag tapes
Rikel, Mark O.; Williams, Robert K.; Cai, Xueyu; Polyanskii, Anatoli; Jiang, Jianyi; Wesolowski, Denne; Hellstrom, Eric E.; Larbalestier, David C.; DeMoranville, Kenneth L.; Riley, Gilbert N., Jr. (IEEE, 2001) -
A shell model for the filament structure of Bi-2223 conductors
Holesinger, Terry G.; Kennison, Jack A.; Liao, Shaolin; Yuan, Yongwen; Jiang, Jianyi; Cai, Xueyu; Hellstrom, Eric E.; Larbalestier, David C.; Baurceanu, Ruxandra M.; Maroni, Victor A.; Huang, Yibing (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2005) -
Significantly enhanced critical current density in Ag-sheathed (Bi,Pb) 2Sr2Ca2Cu3Ox composite conductors prepared by overpressure processing in final heat treatment
Yuan, Yongwen; Jiang, Jianyi; Cai, Xueyu; Larbalestier, David C.; Hellstrom, Eric E.; Huang, Yibing; Parrella, Ronald D. (American Institute of Physics Inc, 2004) -
The use of the in-field critical current density, Jc(0.1T), as a better descriptor of (Bi, Pb)2Sr2Ca2Cu3Ox/Ag tape performance
Schwartzkopf, Louis; Jiang, Jianyi; Cai, Xueyu; Apodaca, Daniel; Larbalestier, David C. (American Institute of Physics Inc, 1999)