Browsing by Author "Feenstra, Ron"
Now showing items 1-3 of 3
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Inter- and intragrain transport measurements in YBa2Cu3O7-x deformation textured coated conductors
Feldmann, D. Matthew; Larbalestier, David C.; Verebelyi, Darren T.; Zhang, Wei; Li, Qi; Riley, Gilbert N., Jr.; Feenstra, Ron; Goyal, Amit; Lee, Dominic F.; Paranthaman, M. Parans; Kroeger, Donald M.; Christen, David K. (American Institute of Physics, 2001) -
Magneto-optical imaging of transport currents in YBa2Cu3O7-x on RABiTS [trademark]
Feldmann, D. Matthew; Reeves, Jodi L.; Polyanskii, Anatoli; Goyal, Amit; Feenstra, Ron; Lee, Dominic F.; Paranthaman, M. Parans; Kroeger, Donald M.; Christen, David K.; Babcock, Susan E.; Larbalestier, David C. (Institute of Electrical and Electronics Engineers Inc, 2001) -
Through-thickness superconducting and normal-state transport properties revealed by thinning of thick film ex situ YBa2Cu3O 7-x coated conductors
Feldmann, D. Matthew; Larbalestier, David C.; Feenstra, Ron; Gapud, Albert A.; Budai, John D.; Holesinger, Terry G.; Arendt, Paul N. (American Institute of Physics Inc, 2003)