Browsing by Author "Eom, Chang-Beom"
Now showing items 11-18 of 18
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Perovskite phase stabilization in epitaxial Pb(Mg1/3Nb2/3)O-3-PbTiO3 films by deposition onto vicinal (001) SrTiO3 substrates
Krajewski, Jeffrey J.; Eom, Chang-Beom; Streiffer, Stephen K.; Pan, Xiaoqing; Tian, Wei; Bu, Sang-Don; Lee, Mark K. (American Institute of Physics, 2001) -
Planar Josephson junctions fabricated with magnesium diboride films
Kahler, David A.; Talvacchio, John; Murduck, James M.; Kirschenbaum, Abigail; Brooks, R.E.; Bu, Sang-Don; Choi, Junghoon; Kim, Dong Min; Eom, Chang-Beom (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2003) -
Positive exchange bias in ferromagnetic La0.67Sr 0.33MnO3/SrRuO3 bilayers
Ke, Xianglin; Rzchowski, Mark S.; Belenky, Land J.; Eom, Chang-Beom (American Institute of Physics Inc., Melville, United States, 2004) -
Strain modification of epitaxial perovskite oxide thin films using structural transitions of ferroelectric BaTiO3 substrate
Lee, Mark K.; Nath, Tapan K.; Eom, Chang-Beom; Smoak, Marcia C.; Tsui, Frank (American Institute of Physics Inc, 2000) -
Synthesis and properties of c-axis oriented epitaxial MgB2 thin films
Bu, Sang-Don; Kim, Dong Min; Choi, Junghoon; Giencke, Jonathan E.; Hellstrom, Eric E.; Larbalestier, David C.; Patnaik, Satyabrata; Cooley, Lance D.; Eom, Chang-Beom; Lettieri, James; Schlom, Darrell G.; Tian, Wei; Pan, Xiaoqing (American Institute of Physics, 2) -
Synthesis and properties of c-axis oriented epitaxial MgB2 thin films
Bu, Sang-Don; Kim, Dong Min; Choi, Junghoon; Giencke, Jonathan E.; Hellstrom, Eric E.; Larbalestier, David C.; Patnaik, Satyabrata; Cooley, Lance D.; Eom, Chang-Beom; Lettieri, James; Schlom, Darrell G.; Tian, Wei; Pan, Xiaoqing (American Institute of Physics, 2002) -
Thickness dependence of structural and piezoelectric properties of epitaxial Pb(Zr0.52Ti0.48)O3 films on Si and SrTiO3 substrates
Kim, Dong Min; Eom, Chang-Beom; Nagarajan, Valanoor; Ouyang, Jun; Ramesh, Ramamoorthy; Vaithyanathan, Venugopalan; Schlom, Darrell G. (American Institute of Physics Inc., Melville, NY 11747-4502, United States, 2006) -
X-ray scattering evidence for the structural nature of fatigue in epitaxial Pb(Zr, Ti)O-3 films
Auciello, Orlando; Eom, Chang-Beom; Streiffer, Stephen K.; Bai, Guo-Ren; Eastman, Jeffrey A.; Ghosh, Kartik C.; Stephenson, G. Brian; Lee, Mark K.; Thompson, Carol; Munkholm, Anneli (American Institute of Physics, 2001)